Experimental Application of l1-Optimal Control in Atomic Force Microscopy
| Authors: | Rieber Jochen M., University of Stuttgart, Germany
Schitter Georg, ETH Zurich, Switzerland
Stemmer Andreas, ETH Zurich, Switzerland
Allgower Frank, University of Stuttgart, Germany |
|---|
| Topic: | 2.1 Control Design |
|---|
| Session: | Optimality Issues in Control |
|---|
| Keywords: | l1-optimal control, 2-DOF control design, atomic force microscopy, experimental application |
|---|
Abstract
This paper presents an experimental application of l1-optimal control. In an atomic force microscope, the vertical position of the piezoelectric tube scanner and thus the cantilever deflection is controlled using a 2-degree-of-freedom control design. The last recorded scan line is fed forward whereas a feedback controller provides stability and setpoint control. Experimental results verify the performance of the approach and giveinsight into applicability, design, and implementation aspects of l1-optimal controllers.
