Online Testing Embedded Systems: Adapting Automatic Control Techniques to Microelectronic Testing

Authors:	Simeu Emmanuel, TIMA Laboratory, France Rufer Libor, TIMA Laboratory, France Mir Salvador, TIMA Laboratory, France
Topic:	4.1 Components and Instruments
Session:	Programmable Devices and Embedded Systems
Keywords:	Fault Detection, Embedded Integrated Circuits, Disturbances, Digital Embedded Filter

Abstract

This paper is aimed at exploiting Fault Detection and Isolation (FDI) techniques widely known inautomatic control for solving online test problem in embedded Integrated Circuits (ICs). Beforereaching this aim, we will briefly review the field of microelectronic testing, introducing basicconcepts and technique. We will next introduce FDI model-based approaches and their application foronline testing of embedded ICs considering linear systems with potential faults and disturbances. Theparity relation-based residual is specially suitable for this type of application. As an example, we willapply it to concurrent fault detection in a digital embedded filter. The proposed scheme will then beillustrated for a linear digital pass-band elliptic filter.